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Help CenterIEC61032/IEC60529 Degrees of Protection IP10-IP40 Against Access to Hazardous Parts Test Probe
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The test probe kits is designed to provide the probes required by IEC61032 and IEC60529 the IP Code standard. It includes the following products:
· Test Sphere Probe with handle with 50N thrust
· Jointed Finger Probe with 50N thrust
· 2.5 mm Test Rod with 3N thrust
· 1.0 mm Test Wire with 1N thrust
· Aluminum suitcases
IP1X Probe A Technical Parameters:
1, Ball Diameter: 50mm
2, Baffle Plate Diameter: 45mm
3, Baffle Plate Thickness:4mm
4, Handle Diameter: 10mm
5, Handle Length :100mm
6, Force: 50N
IP2X Test Finger Probe Technical Parameters:
1, Knurled Finger Diameter:12mm
2, Knurled Finger Length :80mm
3, Baffle Plate Diameter :50mm
4, Baffle Plate Length : 100mm
5, Force: 50N
IP3X Test Probe C technical parameters
1, Test Probe Length :100mm
2, Test Probe Diameter:2.5mm
3, Dam- sphere Diameter:35mm
4, Handle Diameter:10mm
5, Handle Length 100mm
6, Force: 3N
IP4X Test Probe D Technical parameters
1, Test Probe Length :100mm
2, Test Probe Diameter:1.0mm
3,Dam- sphere Diameter:35mm
4,Handle Diameter:10mm
5,Handle Length 100mm
6, Force: 1N
Sherry Xu
Tel:+86-0755-21518810
Email:sherryxu@jusdatest.com
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