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Help CenterIEC60335 Finger Nail Probe With 50N Thruster and CNAS Calibration Certificate
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IEC60335 Finger Nail Probe (test finger nail)
1. Introduction
Finger nail probe is in accordance with the Figure 7 of IEC60335.1 and GB4706.1. Test finger nail is mainly used for the puncture-proof test of the accessible part of the solid insulation, also it is used to test whether the non-removable parts of an electric shock or release moving part are able to withstand the mechanical stresses that occur during normal use.
2. Features:
1). Finger nail probe is consisted by fingertip, middle finger, finger seat.
2). Force applied: 10N, 20N, 30N, 40N, 50N
3). Application: a) Applied 10N force to the surface of scratch test, the material of the scratched surface cannot be separated. b) Use the test finger nail to insert any gap or joint, apply a 10N side force vertically, but do not to twist and sway, the relevant parts can not fall off or damage. C). Use the test finger nail to insert any gap or joint, apply a 10N side force in the direction of component disassembly, but do not twist and sway, the relevant parts can not fall off or damage.
3. Specification:
Nail component |
Finger tip, middle finger and finger stand |
Force |
10N, 20N, 30N, 40N, 50N |
Standard |
IEC60335-1 figure 7, GB4706.1 figure 7 |
4. Usage of the fingernail probe:
Insert the finger into any gap or joint, and vertically apply a 10N force, but don’t twist or pry the finger, the relevant parts shall not fall off or be damaged.
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