NI PXIE-4145 Power Supply and Measurement Module

High-Precision Source-Measure Integration: Integrates voltage source (VS), current source (IS), voltage measurement (VM), and current measurement (IM) functions, supporting four-quadrant operation to simulate power supply or load characteristics.

Wide-Range Parameter Coverage: Supports current output/measurement from picoamperes (pA) to amperes (A) and voltage output/measurement from millivolts (mV) to volts (V), adapting to testing needs of different devices.

Dynamic Testing Capability: Supports pulse mode (minimum pulse width down to microseconds) and sweep mode (voltage/current ramp changes) for transient characteristic analysis (e.g., LED switching characteristics, MOSFET on-resistance).

Real-Time Monitoring and Protection: Built-in overvoltage and overcurrent protection mechanisms, supporting dynamic resistance measurement (DRM) and I-V curve scanning to obtain complete characteristic curves while avoiding device damage.

Semiconductor Device Testing: Threshold voltage, leakage current, breakdown voltage, and other parameter tests for diodes, transistors (BJT/MOSFET), and integrated circuits (ICs).

Electrical Property Analysis of Materials: Current-voltage characteristic characterization of nanomaterials (e.g., graphene), sensors (piezoresistive, capacitive), and photovoltaic devices (solar cells).

Battery and Energy Storage Testing: Charge-discharge curve measurement of lithium-ion batteries, supercapacitor capacity evaluation, and fuel cell polarization curve testing.

Scientific Research and Educational Experiments: Electronics course experiments, electrical property verification in new material R&D, and sensor calibration.

PXIE Interface: Compatible with PXIE chassis (e.g., NI PXIE-1075), supporting PCIe Gen2 high-speed data transmission (bandwidth up to 500 MB/s) to reduce data latency.

Signal Interface: Connects to devices via dedicated terminal blocks like NI SMU-2475A, supporting 4-wire Kelvin testing (eliminating lead resistance effects) and adapting to coaxial cables or banana plugs.

Trigger and Clock Interface: SMA interface for external trigger input/output, supporting synchronous triggering with other PXIE modules (e.g., NI PXIE-5105 oscilloscope) to build multi-parameter testing systems.

Operating Systems: Windows 10/11, Linux, LabVIEW Real-Time, etc.

Software Drivers: Compatible with NI-SMU drivers, supporting development environments such as LabVIEW, C/C++, Python, and MATLAB, and integrable into automated testing workflows.

NI-SMU Driver: Provides a unified API, supporting source-measure parameter configuration, real-time data acquisition and analysis, and multi-channel synchronous control.

LabVIEW: A graphical programming platform with built-in SMU toolkits (e.g., I-V curve scanning, pulse test templates) to lower the development threshold.

Python/C# Interfaces: Supports code-level control via libraries like PyVISA and NI-DAQmx, suitable for integration into automated testing systems (e.g., semiconductor wafer testing platforms).

NI Semiconductor Test System: An automated testing suite for semiconductor devices, including functions like parameter extraction and yield analysis.

NI-DCPower: DC power supply control software supporting batch configuration of multi-channel SMU modules and generating test reports (e.g., Excel, PDF).

MATLAB/Simulink: Supports data import and advanced algorithm development (e.g., device model fitting, noise analysis).

High Precision and Wide Dynamic Range: 1 pA current resolution and 1 μV voltage resolution meet testing needs for nanoscale devices (e.g., single-electron transistors), making it more suitable for modular system integration than traditional benchtop SMUs (e.g., Keithley 2400).

High-Speed Synchronization and Automation: 1 MS/s sampling rate combined with the PXIE bus supports multi-channel parallel testing (e.g., array sensor calibration), reducing testing time.

Low-Noise Design: Built-in low-noise power supplies and shielding circuits reduce measurement background noise (current noise as low as 1 fA/√Hz), suitable for weak signal characterization (e.g., sensor leakage current testing).

Flexible Expansion Capability: Can be combined with modules like NI PXIE-4139 (high-power SMU) and PXIE-5451 (arbitrary waveform generator) to build complete solutions from signal excitation to characteristic analysis.