X-Ray Fluorescence Spectrometer XRF
TY-9800 X-ray Fluorescence Spectrometer
High-Performance XRF Spectrometer for Multi Elemental Analysis
Specification
Accurate, Fast, Non-Destructive, Straightforward, Environmentally Protective
For the elements in the range of Na-U
Halogen-free testing, ROHS/ELV testing
Coating thickness measurement
Identification of jewelry, precious stones, precious metals
Master the unknown material
Outstanding sensitivity leads to up to a factor 3 improved precision
Low measurement cost, easy to operate
Summary
The TY-9800 X-ray fluorescence spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It is an advanced precise analytical instrument that reaches the lead level. It has obvious advantages that don’t need to do special treatment on samples, quick analysis, high analysis accuracy, simple operation and low measurement cost. Also it provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits — yielding remarkable gains in precision and accuracy. It can help test ROHS or ELV and can help follow the toy regulations to ensure the products are green and environmental protection. It deliver much of the analytical power of top-grade laboratory bench top analyzers. And provide exceptional performance, at wide concentration levels, for all of the relevant elements in the range of Na-U.
Applications
TY-9800 X-Ray Fluorescence Spectrometer can perform qualitative and quantitative analysis of elements excluding carbon element on all types of materials. It performs well on elements including Mg, Al, Si, S, P, Mn that are difficult to analyze on other instruments.
1. Steel Industry: Content analysis of element excluding carbon element in pig iron, cast iron, alloy steel, slag, ore, sinter, pellets, iron powder, iron ore.
2. Refractory Material and Cement Industry: Content analysis of refractory materials and cement samples.
3. Nonferrous Industry: The instrument can perform content analysis of Al-alloy, stainless steel, Cu-alloy, Pb-Zn mine, Cu-mine, Ag-mine, and Mo-mine.
4. Quality Inspection Department: Content analysis of elements including Pb, Cd , Cr, Hg, Br and halogen in ROSH instructions.
5. Coating Thickness Measurement: The instrument can perform accurate non-destructive measurement on thickness of all cladding layers on metallic and non-metallic materials.
Parameter
Item | Index |
Analysis elements | Na-U,mainly Al, Si, P, S, K, Ca, Ti, V, Fe, Ni, Mn, Pb, Zn, Cu, Sn, Sb, Ast and so on. |
Analysis range | 1ppm-99.99% |
Simultaneous analysis | Analysis of 30 elements. |
Energy range | 1-50keV. |
Measurement time | The content analysis of all elements to be analyzed can be completed within 1-2 minutes |
Resolution of imported electrical refrigeration semiconductor detector | 130ev |
Tube voltage: 0-50Kv tube current | 1~2000 μA |
Analytical precision | Standard deviation≤0.08%. |
Analytical error | Better than National Standard. |
Radiation dose | <25μsv/h. |
Temperature requirement | 15℃-35℃ |
Working power supply | 220±10% VAC, Frequency 50~60Hz |
Measuring range | 1-40ev |
Resolution | Better than 149eV; |
Repeatability | >97% |
Measure time | 120s (The system automatically adjusts) |
Rated power | 300W |
Instrument size | 600(W)x570(D)x570 (H)mm |
Sample chamber size | 300*300*100m |
Weight | approx 50Kg |







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