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Help CenterDW-XRD-Y3000 Xrd X-ray Diffraction
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DW-XRD-Y3000 Model X-Ray diffraction instrument
Y3000 Series diffractometer is designed for materials reserarch and industrial products analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.
•The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.
• High precision diffraction angle measurement system obtains more accurate results
• High stability of the X-ray generator control system gets more stable repeatability precision
• Programmable operation, integrated structure design, easy operation, elegant outlook.
X-ray diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:
• Unkown samples in a variety of phase identification
• Mixed samples with known quantitative phase analysis
• Crystal structure analysis
• Crystal structure changes under Unconventional conditions (high temperature, low temperature conditions)
•Analysis on material surface film
•Analysis on metal material texture and stress
XRD-Y3000 | |
Rated power |
3kW |
|
Tube voltage |
10-60kV |
|
Tube current |
5-80mA |
X-ray tuble |
glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW |
|
Focus size |
1 x 10mm or 0.4 x 14mm or 2 x 12mm |
Stability |
≤0.01% |
Goniometer structure |
Horizontal ( θ-2 θ) |
|
Radius of diffraction |
185mm |
Scanning range |
0-164 |
Scanning speed |
0.0012° - 70° min |
Max. revolving speed |
100° /min |
Scanning fashion |
θ-2θ linkage, θ,2θ single action; continuous or stepping scanning |
Angle repeatable accuracy |
1/1000° |
Minimal stepping angle |
1/1000° |
|
Detector |
proportional counters(PC) or scintillation counters(SC) |
Maximal counting rate of linearity |
5 x 105CPS ( with the compensate function of drop out counting ) |
Energy resolution ratio |
≤25% (PC),≤50% (SC) |
Counting fashion |
differential coefficient or integral, PHA automatically, Dead time regulate |
Stability of system measure |
≤0.01% |
Scattered rays dose |
≤1 μ Sv/h ( without X-ray protective device ) |
Instrument integrative stability |
≤0.5% |
Figure size |
1100 x 850 x 1750mm |
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