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Help CenterTIME 1130 Handheld Ultrasonic Flaw Detector
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TIME 1130 Handheld ultrasonic flaw detector
1.Product description:
TIME1130 Digital Ultrasonic Flaw Detector is an updated product developed by bringing together the company's 26 years of ultrasonic instrument design and manufacturing experience. It can quickly, damage-free and accurately detect various defects inside the workpiece such as cracks, welds, pores, sand holes, inclusions, and folds. It is widely used in electric power, petrochemical, boiler pressure vessel, steel structure, military industry, aerospace, railway transportation, automobile, machinery and other fields.
Relevant national standards and industry standards
The national and industry standards for ultrasonic flaw detection involved in this instrument are:
-GB/T 12604.1-2005 Non-destructive testing term Ultrasonic testing
-JB/T 10061-1999 A-type pulse reflection ultrasonic flaw detector general technical conditions
-JJG 746-2004 Verification Regulation of Ultrasonic Flaw Detector
-GB/T 11345-1989 Manual Ultrasonic Testing Method for Steel Welds and Classification of Testing Results
-JB/T 4730.3-2005 Non-destructive testing of pressure equipment Part 3: Ultrasonic testing
-JG/T 203-2007 Ultrasonic flaw detection and quality classification method for steel structure, instead of JG/T 3034-1996
-SY/T 4109-2005 Non-destructive testing of oil and gas steel pipelines, instead of SY/T 0443-1998, SY/T 0444-1998, SY/T 4056-1993, SY/T 4065-1993
2.Features
-The newly developed, domestic industry-leading adjustable square wave excitation technology, built-in high-performance "square wave pulse generator" with adjustable options, to achieve the best match with the probe, for the detection of high attenuation materials or thick workpieces It has excellent penetrating power and signal-to-noise ratio; it has high resolution for detecting thin workpieces and composite materials.
-Advanced circuit design, using 12bits 80MHz sampling chip, with 5.7"TFT (640x480) high-resolution color liquid crystal display, to ensure that the echo signal of defects can be displayed and analyzed quickly and accurately, and for various weak and small signals Changes and details can be responded to in time, and the real-time and authenticity of the echo signal are effectively guaranteed, which is extremely beneficial to the analysis and judgment of the nature of the defect. (The picture below shows the full wave display and RF display)
-Support dynamic recording function, can record 4 dynamic recording files, each file can record 2 minutes of real-time waveform at 16 frames/sec. 4 files can be stored in an external U disk, each file is half an hour, channel save, channel storage menu operation, greatly convenient for data analysis and storage (see the figure below).
-Support gray-scale B-scan function, which can display cross-section gray-scale B-scan, a screen can display rich information, which can be used for simple TOFD applications. (The figure below shows the grayscale B-scan function display)
-Abundant waveform freezing functions. The waveform freezing functions include peak value display, waveform comparison, waveform envelope and other functions, as well as timing release capability, which greatly facilitates user operations.
-The machine strictly complies with the requirements of the European standard En12668-1.
-Built-in four main domestic flaw detection standards, which can directly set the three-line offset of the DAC curve by selecting the standard, test block, and flaw detection level. The "American Steel Structure Welding Specification Weld Classification AWS D1.1" evaluation standard is included, so The detection is more handy and convenient for on-site use. (The figure below is the DAC curve diagram)
3.Flaw detection function
Wave crest memory: retrieve the highest wave of defects in real time, and calibrate the maximum value of defects
Practical AVG: Practical AVG curve, automatic conversion of defect φ value (X>3N, N is the near field distance)
Dynamic recording: detection of real-time dynamic recording waveform, storage and playback
Defect location: actual display level value P, depth value D, sound path value S
Defect quantification: actual SL quantitative value (DAC curve real-time quantification)
Defect qualitative: judged by envelope waveform and manual experience
Curved surface correction: flaw detection of curved surface workpieces, correction of curvature conversion
Gray-scale B scan: real-time scan, describing the cross-section of defects
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Basic |
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Units of measurement |
mm, inch, ms |
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Scanning range (mm) |
Zero interface incidence~10000 |
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Sound speed adjustment (m/s) |
600~16000 |
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Probe delay (μs) |
-1.000~750.000 |
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Display delay (μs) |
-20~ 3400 |
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Way of working |
Single probe, dual probe, transmission |
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Waveform display mode |
A scan display, gray scale B scan display, AB scan display at the same time |
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Pulse generator |
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Pulse form |
Analog square wave |
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Transmitting power supply (V) |
100~400, 10V step adjustable |
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Transmit pulse width (ns) |
75, 100~500, 50ns step adjustable |
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Probe damping (Ω) |
50, 100, 200, 500 |
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Transmission repetition frequency (Hz) |
10~1000 |
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Receiver |
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Gain (dB) |
0~110 points 0.1, 0.2, 0.5, 1.0, 2.0, 6.0, 12.0 adjustable |
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Total bandwidth (MHz) |
0.5~20 |
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Detection method |
Positive half wave, negative half wave, full wave, radio frequency |
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Vertical linearity error |
±2% |
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Amplifier accuracy (dB) |
±1 |
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inhibition(%) |
Screen height 0~80 |
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Sampling rate (MHz) |
Single chip 80 12bits |
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Transmit crosstalk suppression (dB) |
≥80 |
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Dynamic range (dB) |
≥40 |
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Instantaneous resolution (dB) |
≥32 |
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Horizontal linearity error |
≤0.1% |
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Sensitivity margin |
≥62dB |
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Measuring |
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Measuring gate |
2 independent measuring gates |
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Detection method |
Edge, peak |
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Gate measurement |
The amplitude, sound path, depth, projection, etc. of the echo |
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freeze |
Freezing methods include: full freeze, peak, comparison, envelope, etc. |
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AVG equivalent calculation |
Automatic calculation of defect equivalent evaluation based on defect echo and AVG curve |
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DAC defect quantification |
Evaluate defects based on defect echo and DAC curve |
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Gate logic |
Off, measurement, incoming wave alarm, lost wave alarm |
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Gate alarm |
Off, instant, hold.2s, hold.5s, hold 1s, hold 2s, latch |
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Alarm buzzer |
Off, on |
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Output interface |
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data storage |
50 detection parameter channel records |
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1000 waveforms |
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(Including 980 A-scan waveforms and 20 B-scan waveforms) |
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4x2000 frame dynamic waveform |
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Data management |
Realize the storage, viewing, and playback operations of channels, waveforms, and dynamic records |
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All of the above can be stored to local or U disk |
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Communication |
Communicate with PC through USB interface |
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