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SPRK-OES ferrous&non-ferrous metal analyzer
Introduction:
Optical emission spectroscopy (OES), also called atomic emission spectroscopy (AES) or arc spark emission spectroscopy, is an important tool for fast and accurate elemental analysis of metals and semiconductors.
Optical emission spectrometry involves applying electrical energy to a metal sample to excite the evaporated and vaporized atoms. In this case, "applying electrical energy" means an electrical discharge between the sample and an opposing electrode.
Spectral lines:
These excited atoms and ions in the discharge plasma create a unique emission spectrum for the element, as shown on the right. It can be seen that even a single element generates numerous emission spectral lines.
Therefore, the light generated by the discharge can be said to be a collection of the spectral lines generated by the elements in the sample. This light is split by a diffraction grating to extract the emission spectrum for the target elements. The intensity of each emission spectrum depends on the content of the element in the sample. The detectors (photomultiplier tubes) measure the absence or presence of the spectrum extracted for each element and the intensity of the spectrum to perform the qualitative and quantitative analysis of the elements.
JB-750 optical emission spectrometers feature Pulse Distribution Analysis (PDA) to enhance the measurement reproducibility (accuracy). This method involves statistically processing the emissions from the spark pulses obtained from spark discharges in an argon atmosphere. The optical emission spectrometer achieves rapid elemental analysis of solid metal samples, making it an indispensable instrument for the control of steel making and aluminum metallurgy processes.
Allocating and analyzing channel and quantitative work scale
Major Features
1,The human oriented design, the standardized and modularized manufacture make the apparatus smaller.
2,The core components are all imported, which strengthen the stability and reliability of the apparatus.
3,We adopt the advanced foreign technologies of excitation source and design the excitation source of high energy, high stability by our own to fulfill the needs of ultrahigh content and trace analysis.
4,It adopts overall exit slit using technology which is convenient for choosing passage and regulating.
5,The high voltage of the PHT in the apparatus is controlled directly by computer and regulated by software, which improved efficiency of the passage.
6,In the apparatus, there is an automatic constant temperature system which solve the problem of bad effects to the optics system caused by changing temperature.
7,The multi-language operation software and flexible configuration enable the apparatus more humanistic.
8,This apparatus can analyze various kinds of matrix, such as Fe, Co, Ni, Ti, Cu, Al, Pb, Mg, Zn and Sn.
The configuration of the product
Direct Reading Spectrometer
Main Parameters
Excitation light source:
Supply voltage: 50Hz, 220V ± 1%
Input power: 1.0KVA
Charging capacitor: pre-combustion 8μF, exposure 1.5μF
Peak Current: pre-combustion 100A, exposure 20A
The main circuit peak pressure: 300VDC (with automatic adjustment of peak pressure)
Ignition circuit: pulse amplitude: +15 KV
Auxiliary gap: Using Tunnel Diode
Discharge frequency: 200 Hz ~ 600 Hz
Sample sets of gap: 4mm
Spectrometer:
Analysis band range: 130 ~ 650nm
Machine engraved concave grating: Curvature radius of 750mm
Depicts the density: 1667/mm
Incidence angle: 35 degrees
Allows a maximum of channels: 36
Spectrometer Local temperature: 35 °C ± 0.5 °C
Control System:
Measurement and Control System: The single board computer measurement and control, data exchange with the Host Computer
Reproducibility: RSD ≤ 0.2%
Photomultiplier tube high voltage power supply:
Stability: 8 hours is better than 0.5%
Common element content range channel table of non-ferrous metal
Element |
Content range% |
Channel |
Element |
Content range% |
Channel |
P |
0.005~2.0 |
1 |
Sb |
0.005~0.50 |
1 |
Sn |
0.002~10.0 |
2 |
Al |
0.005~10.0 |
1 |
Zn |
0.01~10.0 |
2 |
Cd |
0.0005~0.50 |
1 |
Si |
0.005~20.0 |
2 |
As |
0.001~0.10 |
1 |
Fe |
0.005~10.0 |
2 |
Bi |
0.002~0.50 |
1 |
Cu |
0.005~10.0 |
2 |
Be |
0.002~0.50 |
1 |
Mg |
0.005~10.0 |
2 |
Zr |
0.002~3.0 |
1 |
Mn |
0.002~3.0 |
1 |
La |
0.001~0.50 |
1 |
Ti |
0.005~1.0 |
1 |
Ce |
0.001~0.50 |
1 |
Ni |
0.005~3.0 |
1 |
Pr |
0.001~0.50 |
1 |
Cr |
0.005~3.0 |
1 |
Nd |
0.001~0.50 |
1 |
Pb |
0.005~10.0 |
2 |
Sm |
0.0005~0.50 |
1 |
B |
0.002~0.50 |
1 |
Ga |
0.0005~0.50 |
1 |
V |
0.002~0.50 |
1 |
Sr |
0.002~0.50 |
1 |
SPRK-OES ferrous&non-ferrous metal analyzer
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