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Help CenterJointed Test Probe of IEC 62368-1 Annex V Figure V.1
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V.1.2 Test method 1 - Surfaces and openings tested with jointed test probes
For surfaces and openings, the following jointed test probe is applied, without appreciable force and in any possible position, to the surfaces and openings of the equipment.
the test probe of Figure V.1 for equipment that is likely to be accessible to children;
NOTE 1 Equipment intended for use in homes, schools, public and similar locations is equipment generally considered to be accessible to children, see also Clause F.4.
the test probe of Figure V.2 for equipment that is not likely to be accessible to children.
Where entry behind a door, panel, removable cover, etc. is possible without the use of a tool or entry is directed by manufacturer instructions or marking, with or without the use of a tool the test probe is applied to surfaces and openings in those areas.
Where the entire probe passes through a large opening (allowing entry of an arm but not of as shoulder), the probe shall be applied to all parts within a hemisphere with radius of 762 mm. The probe handle shall point along a path towards the large opening to simulate the hand on the end of the arm extending through the large opening. The plane of the hemisphere shall be the outside plane of the opening. Any part outside the 762 mm radius hemisphere is deemed not accessible.
Figure V.1 - Jointed test probe for equipment likely to be accessible to children
Figure V.2 - Jointed test probe for equipment not likely to be accessible to children
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