Home > Products > IEC Test Finger Probes > IEC 60529 Jointed Finger Probe for IP2X Testing
IEC 60529 Jointed Finger Probe for IP2X Testing
- 100 Piece / Pieces per Month
- Shenzhen
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- 3 days
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Product Details
Brand Name | Pego | Place of Origin | China | |
Model Number | PG-TPB |
Product Description
IEC 60529 Jointed Finger Probe for IP2X Testing
1. Introduction:
Test probe B ( jointed test finger) is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. The probe B is intended to verify the protection against to hazardous parts with human finger.
2. Specification
Diameter of dactylogryposis: | 12mm | Length of dactylogryposis: | 80mm |
Diameter of baffle: | 50mm | Length of baffle: | 100mm |
Thruster (optional) | 10N±10% | Test IP grade | IP2X |
Material: Insulating material (baffle and handle), metal(dactylogryposis) |
Contact Us
- Pego Electronics (Yi Chun) Company Limited
- Contact namePenny Chat Now
- Phone86-0795-3560528
- AddressNo. 429, Yichun South Road ( Happiness Park), Yuanzhou District,, Yichun, Jiangxi
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