IEC62368 Annex V Straight Unjointed Test Probe,Figure V.1 Jointed Test Probe,Figure V.4 Wedge Probe
The test is conducted by means of the straight unjointed version of the applicable test probe of Figure V.1 or Figure V.2, applied with a force of 30 N ± 3 N for a short time duration of approximately 5s.
Openings tested with straight unjointed test probes
Openings preventing access to a part by the applicable jointed test probe of Figure V.1 or Figure V.2 are further tested by means of a staight unjointed version of the respective test probe applied with a force of 30 N. If the unjointed probe enters the openings, test method 1 is repeated, except that the applicable jointed version of the test probe is pushed through the opening using any necessary force up to 30N.
Figure V.1 Jointed test probe for equipment likely to be accessible to childeren
Figure V.1 Unjointed test probe
Figure V.2 Jointed test probe for equipment not likely to be accessible to children
Figure V.2 Unjointed test probe
Figure V.3 Blunt probe
Figure V.4 Wedge probe
Figure V.5 Terminal probe
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