Flexible Manual Control Surface Roughness/Contour Measuring System

China BEST Brand contour measurement machine 

Flexible Manual Control Surface Roughness/Contour Measuring System

Wilson, the ranking contour and roundness measuring machine manufacturer and supplier in China.

Wilson,one of the drafting members of the Industry Standard for Contour Measuring Machines(JB/T 11271-2012)
Wilson,one of the drafting members of the National Standard of Roundness Measuring Machines(GB/T 26098-2010)

MMD-HPG series Contour & Roughness Measurement System (Mitutoyo analogue,Accretech variants), a high accuracy contact type CNC contour and surface roughness measuring system

To meet the request of contour and roughness combined measurements, the MMD-HPG series delivers a high level of metrological performance with resolution in nanometer range as well as residual error of <5nm Ra.

This MMD-HPG Series is an automated surface finish (roughness, waviness), form, contour measurement instrument designed for the shop floor environment. This equipment delivers 40-60 mm detector range and 0.001um resolution. 

The system can be designed to your individual requirements for analysis of crankshafts, heads, blocks, gear box casings and so on.

Main parameters:

X axis(horizontal guide rail): 100-300 mm

Z1 axis(sensor): 40-60 mm

Z axis (column): 400-500 mm

Special models can be customized

Main Functions

1. Contour Measurement Function

Point: point, midpoint, intersection point, highest point, lowest point

Line: straight line, cut line, vertical line, parallel line, flat line

Circle: round, ellipse, cut circular

Angle: angle, horizontal angle, vertical angle

Position tolerance: straightness, convexity, contour, vertical, parallelism

Auxiliary generation: including auxiliary points, auxiliary lines, auxiliary circles

2. Roughness Analysis

Ra，Rq，Rz（Ry），Rz（DIN），R3z，Rz（jis），Rp，Rv，Rt，Rsk，Rsm，Rc，Rpm，Rku，Rdq，Roc，Mr1，Mr2，Rpk，Rvk，Rk，Rdc，A1，A2，R，Rx，AR，Rcp，Rmax，Rz-ISO

3. Waviness Analysis

wt，wa，wp，wv，wq，wc，wku，wsk，w，wx，wz，wsm，wdc，wte，wmr，Aw，c（wmr）wmr（c），wdq

Main features:

● The first domestic technology of autonomous intellectual property rights: using grating sensors to meet the measurement of roughness and contour size at the same time

● Use the interference to scan the grid ruler, which can reach 1nm, which can meet the super high precision measurement

● Ultra -high resolution sensor can meet the measurement of roughness and contour dimensions at the same time. No need to change the sensor during the measurement process

● A large number of processes and high precision are compatible, which can meet the integrated measurement of irregular surface roughness and size such as arc surface, column surface, free curved surface

● The unique roughness evaluation algorithm and position compensation method, effective correction and compensation surface measurement is the measurement error of non -plane, and effectively guarantee the roughness of the curved surface, the roughness of the arc workpiece as high accuracy and high accuracy as the plane roughness.

● No need to modify mathematical methods and close to zero friction coefficient rails, which can maintain a high -precision measurement benchmark for a long time. The accuracy is consistent.

● Custom template, batch measurement, automatic marking