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Help CenterDJ-SEM150 Scanning Electron Microscope
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DJ-SEM150 Scanning Electron Microscope
Small footprint
Magnification:30X~150,000X
Resolution: 5nm
SE Detector+BSE Detector
Powerful software
Easy to use
Easy to maintain
Specification:
Magnification Max 150,000 X;
Signal Detection: SE Detector+BSE Detector;
Accelerating Voltage:1kV to 30kV,High image resolution;
EDS for component analysis is optional;
Installation a cooling stage to measure aqueous samples without pretreatment;
High & Low Vacuum System;
The CCD camera is mounted to view the inside of the stage;
Tilt stage configuration(optional).
Features:
1. X, Y-axis : 40mm / R-axis : 360°, Z : 0~35mm / Tilt-axis : 0~45°
2. Accelerating Voltage:5kV to 30Kv, High image resolution
3. Installation a cooling Stage to measure aqueous samples without pretreatment.
4. The CCD camera is mounted to view the inside of the stage.
5. 4 step variable sleeve aperture, High-resolution images can be provided by adjusting the beam size.
6. Automatic focus, automatically adjust the contrast and brightness, adjust the electron beam size, eliminate astigmatism.
7. Large sample chamber, to observe a wide variety of sample, optional EDS, BSE, motor control stage and other accessories.
Parameter:
Model |
DJ-SEM150 |
Resolution |
5nm (30kV, SE Image) |
Magnification |
30X-150000X |
Acceleration voltage |
1kV to 30kV (1kV/5kV/10kV/15kV/20kV/30kV -6 step) |
Signal Detection |
(SEI)-Secondary Electron Image |
(BSEI)-Backscattered Electron Image (Option) | |
* Multi Detector (SE+BSE) | |
Observation mode |
Standard Mode |
Charge-up reduction mode | |
Electron gun | |
Filament type |
Pre centered tungsten filament cartridge |
Bias voltage system |
Automatic mode |
Electron gun alignment |
Manual mode |
Lens system | |
Focus Lens |
2-stage Electromagnetic Condenser Lens |
Objective Lens |
1-stage Electromagnetic Objective Lens |
Detector type |
SE Detector/ BSE Detector |
Stage System | |
Stage Traverse |
5-axis System, X, Y-axis : 40mm / R-axis : 360°, Z : 0~35mm/ Tilt-axis : 0~45° Or automatic control. |
Image shift |
Image shift X, Y Image Shift (±150um) |
Max Sample size |
80mm in diameter, 30mm in height |
Image Scanning system |
(Fast Scan): 320x240 (Scan time: 0.1sec.) |
(Slow Scan): 640x480 (Scan time: 3 sec.) | |
1(Photo Mode 1): 1280x960 (Scan time: 30 sec.) | |
2(Photo Mode 2): 2560x1920 (Scan time: 60 sec.) | |
3(Photo Mode 2): 5120x3840 (Scan time: 120 sec.) | |
Automatic Function |
Auto start, Auto focus, Auto Brightness/Contrast |
Image format |
BMP, JPEG, PNG, TIFF |
Data display |
Magnification, Detector type, Accelerating Voltage, Vacuum mode, Logo(Text), Date and time, Text marker, scale bar etc. |
Vacuum system |
Fully Automatic Multi mode |
Control unit system |
Mouse, Keyboard |
PC |
PC: Desktop USB 2.0 |
Software function |
Image file open, edit, save |
Volume |
Main Unit-410(W)×660(D)×600(H)mm……1set Controller: -410(W)×290(D)×520(H)mm……1set |
Weight |
105kg |
Equipment environment |
Temperature:15℃~30℃ |
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