Repetitive Shock Vibration Table for Semiconductor

Overview

 This Shock control measurement system is a special shock wave capture and analysis platform that based on high quality DSP con structuredynamic measure, analysis and control. It consists of control system, measurement system & software system based on WINDOWS to control modular & low noise design measurement hardware to achieve control & measure sub functionalhardware electrical circuit installing in the interface cabinet with independent integral con structure( independent control cabinet and measurement cabinet). USB2.0 is introduced to connect the communicationof interface cabinet & PC

Main Specifications 

Accelerated Shock Test Systems Mechanical Impact Test Machine Specifications
1.Built-in self-protection device, no secondary impact,
2.Shock height controlled by digital
3.Good repeatability test data
4.Signal generator provides a variety of choice: half sine wave, trapezoidal wave, sawtooth wave, square wave, etc.
5.Good vibration isolation performance, impact on the environment can control within the scope of the requirements:
6.Good Safety performance.
7.Conform to the IEC, MIL, GJB, JIS, ASTM and other international and domestic standard shock waves;

Impact platform working principle
The SBM impact control measuring instrument is operated to start the AC motor, and the lifting device is driven by the transmission chain to raise the table top (including the test piece) to a preset height, and then the lifting device is separated from the table top (test piece) by the selecting device. The table top (test piece) becomes a free fall impact on the cushion, resulting in a half-sine shock pulse. Adjusting the height of the table can change the acceleration value of the shock pulse; changing the material of the cushion and the thickness of the cushion can change The duration of the shock pulse.

Rise, fall, automatic
Used to control the rise or fall of the test bench table (ie, adjust the drop height). When the operation starts, it is the "automatic" control state, and the system automatically controls the test bench table drop height according to the set impact acceleration value (the "auto" indicator turns red). When you hit "up" or "down", the test bench height will rise or fall (the "up" or "down" indicator turns red and the "auto" indicator turns gray). If you press "up" or "down", the test bench will stop changing (the "up" or "down" indicator will turn gray). If you still want to restore the "automatic" control, then hit "automatic".
"Rise", "Descent", "Auto" must be effective when the system is running, and the operation is invalid when the system is stopped.

Interface for viewing any impacts that need to be viewed in the total number of impacts (including individual actual parameters). When you hit "", the number of impacts is reduced once, and the number of impacts is increased once. You can also type the number of impact times you want to view directly in the "Number of Impacts" in the setting parameter input area. When the number of tests is more than 1000 times, the "archive" always retains 1000 interface data to provide access to any impact interface data of the application: n2-n1=1000
Where: n2 — number of last impacts
N2 —n2 -1000 impact times
For example: the number of collision tests is 1520 (times)
Then: the last impact number n2 = 152 (times)
N1 = n2-1000=1520-1000=520 (times)
Therefore, the data of any impact interface from the 520th to 1520th range can be adjusted to the application. "", "" must be operated when the system is stopped

Steps
1 preparation
1-1 Connect the computer, interface box, monitor, keyboard, and impact test bench with a dedicated cable (our company has already connected it during installation and commissioning).
1-2 Turn on the power supply to the computer, the interface box, and the monitor with a dedicated power cord.
1-3 Wipe the bonding surface of the accelerometer and the test bench with acetone, and rigidly bond the accelerometer to the test bench with 502 glue (also available with screws or other connection methods).

1-4 After the acceleration sensor is firmly bonded to the test bench, it is firmly connected by a dedicated cable (low noise cable) (one end is connected to the acceleration sensor output port, and the other end is connected to the rear panel "sensor input socket").