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Iec60884 Jointed Test Finger Probe B
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Product Details
| Brand Name | bnd | Place of Origin | Guangdong, China | |
| Model Number | IEC61032 |
silver package for iec60884 jointed test finger probe B
Product Description
iec60884 jointed test finger probe B
IEC61032 IEC60529 IEC60335 (Test probe B) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances
This is the “International” test finger required by most IEC61032 test probe B, EN Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements with integral palm simulator.
The handle and stop face are made of nylon. Finger is made of stainless steel. All parts precision machined.
- BND-A: Conform to the IEC60335-1 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 50 mm, instead of the non-circular face.
- BND-B: Conform to the IEC60335-2-14 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 125 mm instead of the non-circular face, the distance between the tip of the test finger and the stop face being 100 mm.
Using methods:
1,The joint portion of Standard test finger can not touch the live parts or hazardous parts ,and it can’t enter 20mm-50mm baffles
2,Prevent access to dangerous parts of the test requirements, Test B need to bring 30 ± 3N thrust. Usually use with force gauge
3,In the electric shock test, we need to wire and configure the power supply(mains), the lamp unit.
Note
Test probe is precision stainless steel products, please use of gently and pay attention to maintenance
IEC61032 IEC60950 IEC60335
IEC60529 IEC60045 IEC60884
IEC60745
Knurled Finger Diameter:12mm
Knurled Finger Length:80mm
Baffle Plate Diameter:50mm
Baffle Plate Length:100mm
Baffle Thickness:20mm
Product picture | Reference Standard | Specification |
IP1X Test Probe A | IEC60529 IEC61032 IEC60335 IEC61029 IEC60745 IEC60065 IEC60950 | Ball Diameter:50mm Baffle Plate Diameter:45mm Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm |
IP2X Test Probe B | IEC61032 IEC60950 IEC60335 IEC60529 IEC60045 IEC60884 IEC60745 | Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm |
IP3X Test Probe C | IEC61032 IEC60529 | Test Probe Length:100mm Test probe Diameter:2.5mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm |
IP4X Test Probe D | IEC61032 IEC60529 | Test Probe Length:100mm Test probe Diameter:1.0mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm |
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- Shenzhen Bonad Instrument Co., Ltd.
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