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ul Standard Articulated Finger Probe Dimensions
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Product Details
| Brand Name | bnd | Place of Origin | Guangdong, China | |
| Model Number | UL test finger probe |
Safety Aluminum foil box for ul standard articulated finger probe dimensions
Product Description
ul standard articulated finger probe dimensions
The articulated UL finger test probe is also called UL articulated probe or jointed test finger probe. It conforms to many standard requirement of UL474 Fig 5.1, UL507 Fig 9.2(PA100A), UL982 Fig 7.1, UL1017 Fig 2, UL1062 Fig1.2, UL1278Fig 8.3, UL1310 Fig 16.2, UL6500 Fig14, UL60065 Fig14 and UL60950 Fig NAF.1. Palm simulator and restricted joint movement simulates human finger movement. It is widely used in the enclosure protection test of the electrical equipment.
Note
Test probe is precision stainless steel products, please use of gently and pay attention to maintenance
UL507 UL982
est Finger Length:234mm
The Bending Part Length:
30/30/40mm
Product picture | Reference Standard | Specification |
figure 1 | IEC61032 | Nodular Finger Length:100MM Curved Finger Length:30/30/40mm Nodular Finger diameter:125mm |
Figure 2 | GR1089 | Nodular Finger LENGTH:90MM Curved Finger Length:30/30/30mm Nodular Finger diameter:12mm |
Figure 3 | UL507 UL982 | Test Finger Length:234mm The Bending Part Length: 30/30/40mm |
Figure 4 | IEC61032 IEC60950 IEC60335 IEC60529 IEC60045 IEC60084 IEC60745-1 | Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm |
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Iec 61032 Figures 12 and 13, Jointed Child Finger Probes With Human Finger and Arm
Iec 60065 Ipx Test Probe Finger 11 Equipment
IEC 61032 Figure 2 Test Probe B With Metal
Iec 61032 Figure 2 Test Finger Probe b Ip2x
Iec 60335 Figure 7 Fingernail Test Probe With 50N Force
Articulated Test Probe Finger for Underwriters Laboratories Standards






IEC 61032 Accessibility Probe Jointed Children Test Finger
IEC61032 Short Test Pin 13 Laboratory Test Probe
UL507 PA130 Enameled Wire Test Probe
UL507 Test Probe PA140 Enameled Wire Probe
IEC Standard IP1X Test Probe With Steel Ball
IEC61032 IEC60529 IP3X Test Probe With 2.5mm Pin
IEC61032 Unjointed Test Finger Probe 11 for Electrical Safety Test
IEC60335 Figure 7 Test Finger Nail With 10 to 50N
IEC61032 Articulated Test Finger Probe IP2X Test Finger
IEC60529 Figure 1 IP1X Test Probe A With Stainless Steel Ball
IEC61032 IP2X Articulated Test Finger With 10N-50N Force
Model BND-D 1.0mm Test Probe Test Rod IP4X Accessibility Probes
Series BND-PD Creepage Distance Test Card Creepage Length Measuring Tool
Stainless Steel Feeler Gauge
Hardened Steel Scratch Pin Probe for IEC 60335
Model BND-D IEC 60529 IP4 1mm Accessibility Probe Pin
50mm IEC Accessibility Test Pin Probe
Model BND-BF50 12mm IP2 Jointed Finger Probe With 50N Force