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Help CenterCeyear 3986H Noise Figure Analyzer，10MHZ to 50GHZ
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Ceyear 3986H Noise Figure Analyzer，10MHZ to 50GHZ
Noise Figure Analyzer 3986A ：10MHZ to 4GHZ
Noise Figure Analyzer 3986D ：10MHZ to 18GHZ
Noise Figure Analyzer 3986E ： 10MHZ to 26.5GHZ
Noise Figure Analyzer 3986F ： 10MHZ to 40GHZ
Noise Figure Analyzer 3986H ：10MHZ to 50GHZ
Noise Figure Analyzer 3986L ： 10MHZ to 67GHZ
Main Features
• Wide frequency coverage
• High-sensitivity reception and high-precision measurement performance
• Chinese and English operation interface, big screen dual channel HD display
• Amplifier, Up converter and down converter measurement mode
• Single sideband and double sideband measurement function
• Comprehensive loss compensation function
• Flexible file and table processing functions
• Passed/failed test notification limit line function
• Various external interfaces
• Dual noise source drive
Product Overview
3986 Series Noise Figure Analyzers include 3986A (10 MHz～4 GHz), 3986D (10 MHz～18 GHz), 3986E (10 MHz～26.5 GHz), 3986F (10 MHz～40 GHz) and 3986H (10 MHz～50 GHz). Features of the product include wide-range frequency coverage, high-sensitivity reception, friendly user interface, big screen dual channel HD display, various external interfaces, and dual noise source drive etc. It can measure the noise figure and gain of amplifiers, up converters and down converters, as well as to support automatic measurement of noise figure of multi-stage converters. Guide interfaces are intuitive for setting measurement modes. The comprehensive loss compensation function can compensate loss induced in measurement channel before and/or after the device under test by means of fixed or table forms. The built-in noise figure measurement uncertainty calculator does quantitative analysis of the uncertainty of measurement noise figure. Limit line function that provides test passed/failed notification simplifies the determination of passed/failed test. User friendly features make it easy for engineering technicians to set measurements correctly, to observe and save measurement results in different forms. They can be widely used in R&D, manufacturing, testing and technical assurance tests of electronic equipment for communication etc.
Features
Wide frequency coverage
The coaxial integrated frequency of 3986 series Noise Figure Analyzers covers the range of 10 MHz～50 GHz, where 5 frequency range configurations are selectable for different user's test demand of different band. With external MMW extended frequency modules, the noise figure measurement frequency range can be extended to 110GHz.
High-sensitivity reception and high-precision measurement performance
The optimum reception sensitivity precedes -170 dBm/Hz, and the full-band reception sensitivity precedes -162 dBm/Hz. It adopts automatic adjustment and precise calibration technologies, which improve the channel gain. And the linearity within the range of noise power measurement precedes ±0.1 dB.
Chinese and English operation interface, big screen dual channel HD display
Chinese and English operation interface with 10.1 inch big screen LCD monitor that can display in three formats, i.e. graphs, tables and meter display. In the form of graph display, it can display in combination the measurement results of two arbitrary parameters which change along with frequency, such as noise figure, Y factor, gain, and equivalent input noise temperature.
Amplifier, Up converter and down converter measurement mode
Basic amplifier measurement mode is used for noise figure and gain measurement of the device under test, which falls in the amplifier category within the frequency range of the Noise Figure Analyzers. The extended frequency range measurement in the down converter mode is used for noise figure and gain measurement of amplifier, of which the frequency exceeds the frequency range of the Noise Figure Analyzers.
They have noise figure and gain measurement functions of up converters and down converters, as well as to support automatic scanning measurement of noise figure of multi-stage converters.
Interface setting in measurement mode is intuitive. All measurement settings corresponding to measurement mode can be done in the same test interface.
Single sideband and double sideband measurement function
It has the capacity of setting, controlling and data processing for the measurement of single sideband (including upper sideband and lower sideband) and double sideband. During noise figure measurement, the sideband setting must be the same as that is actually applied of the device under test.
Typical Applications
Basic amplifier measurement
Basic amplifier measurement is the most common measurement mode. It's used for noise figure and
gain measurement of the device under tests without frequency conversion (including active or
passive linear units or systems like amplifiers, filters, and isolators).
System down converter measurement mode
The down converter mode focuses on extended frequency range measurement of amplifier. When
the frequency range of an amplifier exceeds that of the Noise Figure Analyzers, extended
frequency range measurement of the noise figure is realized by an external mixer. External mixer is
used during calibration and measurement as a part of the test system. To reduce the uncertainty of
noise figure measurement, frequency conversion loss and noise figure of the chosen mixer should
be as small as possible. Besides, the intermediate frequency output port of the mixer should be well
isolated to local oscillation signals.
Up/down converter measurement
The device under test is an up/down converter installation, up converter and transmitter or down
converter and receiver for instance, then the output intermediate frequency would be in the
frequency range of the Noise Figure Analyzers. During up/down converter measurement, 3986
series Noise Figure Analyzers provide two modes of settings, fixed intermediate frequency, variable
local oscillation and fixed local oscillation, variable intermediate frequency, which are used for
measuring the RF response characters and intermediate frequency response characters of the
device under test, respectively.
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