VDE 0470 part 2 picture 2 probe B Joint Finger Probe iec test equipment

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VDE 0470 part 2 picture 2 probe B Joint Finger Probe iec test equipment 

  IEC61032  IEC60065 The Standard Test Finger Probe

Article NO.: BND-B

in accordance with VDE 0470 part 2 picture 2 probe B resp. IEC/EN 61032:1993
Additional standards: VDE 0470 Part 1 resp. IEC/EN 60529, IEC/EN 60950, IEC 61010, IEC/EN 60335, IEC/EN 60745-1, IEC/EN 60034-5, IEC/EN 60065, IEC/EN 60601
Access probe to assess protection of persons against access to dangerous parts and the proof of protection against access with a fi nger.
The joint parts are made of high-grade steel. The handle and the stop surface consist of polyamide. In accordance with the standards the links can be positioned at a right angle. For contact- and continuity checks a 4 mm receptacle is integrated at the handle, that is conductively connected to the fi nger probe.

Technical Parameters:

According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032, IEC69745-1

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm

Company Profile

Shenzhen Bonad Instrument Co., Ltd.

 14 Stanards drafted and issued by Labthink  -- 100 Patents granted by Labthink -- 410 m2 Laboratory to provide testing services  -- 20 years experienced lab technicians to provide solutions -- 12 months warranty  -- Remote Services (Free of Charge allthrough lifetime)

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