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IEC61032 Test Finger probe C Diameter 2.5mm
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Product Details
Brand Name | BND | Place of Origin | Guangdong, China | |
Model Number | BND-C |
safety aluminum box and standard export package for IEC 61032 test probe c
Product Description
IEC61032 Test Finger probe C Diameter 2.5mm
1N/20N TEST PROBE PIN
BND-14A
Technical Parameters:
1, Test Probe Length:80mm
2,Probe Diameter:1.0mm
3,Standard: IEC60884 -1 ,Fig.10
4,force: 1N
BND-14B
Technical Parameters:
1, Test Probe Length:80mm
2,Probe cross sectional area:3.0*1.0mm
3,Standard: IEC60884 -1 ,Fig.9
4, Force:20N
1 Product Explanation
The socket protection door test needle probe meets the standard requirements of IEC 60884&GB2099 , mainly used for checking the electronic shock safeguard and the normal operating function of socket with protection door. According to the related requests ,a set of test probe has two sticks, respectively with a 1N and 20N force. This manual focuses on against electric shock protection test.
2 Method of Application
First, use the 20N socket protection door test probe to exert a 20N thrust to the most unfavorable position of the protection door at three directions in sequence, at the same position of three directions with a 20N thrust for about 5 seconds, the metal part cannot touch the live parts of the socket.
NOTE: During the operation, the probe cannot be rotated. When the probe changes from one direction to another direction, do notexert forces, and the probecan't pulled out.
Then ,use the 1N socket protection door test probe and exert a 1N force to three directions. Each direction for about 5 seconds, the metal part can't touch the socket with the electric components.
NOTE: This test requires independent touch, after each touch the probe must be pulled out.
IEC61032 iec60529
Product picture | Reference Standard | Specification |
IP1X Test Probe A | IEC60529 IEC61032 IEC60335 IEC61029 IEC60745 IEC60065 IEC60950 | Ball Diameter:50mm Baffle Plate Diameter:45mm Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm |
IP2X Test Probe B | IEC61032 IEC60950 IEC60335 IEC60529 IEC60045 IEC60884 IEC60745 | Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm |
IP3X Test Probe C | IEC61032 IEC60529 | Test Probe Length:100mm Test probe Diameter:2.5mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm |
IP4X Test Probe D | IEC61032 IEC60529 | Test Probe Length:100mm Test probe Diameter:1.0mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm |
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- Shenzhen Bonad Instrument Co., Ltd.
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