Home > Products > IEC test Probes > iec 61032 test probe 41 iec accessibility probe
iec 61032 test probe 41 iec accessibility probe
- 100 Piece / Pieces per Month
- Shenzhen China
- T/T Credit Card
-
IEC60884 1N 20N test gauge test probe
-
IEC/EN 61032 Jointed Test Finger articulated finger probe standard test finger
-
IP4X Safety Test Finger IEC61032 Figure4 Test Probe D
-
IEC 60950 and IEC 61010 standard test finger probe
-
IEC60335 test fingernail probe
-
accessories jointed test probes for paper shredders
Product Details
| Brand Name: | BONAD, BONAD | Place of Origin: | Guangdong, China | Model Number: | BND-41, BND-41 |
Packaging Details
aluminum box +carton box
Product Description
iec 61032 test probe 41 iec accessibility probe
iec 61032 test probe 41 iec accessibility probe
Article NO.:BND-41
Specification:
Test Probe / Test Probe 41 / IEC61032 Test Probe
1, According to : IEC335, IEC61032 probe 41,
Technical Parameters:
1,Test Rod Diameter: 30mm
2, Rigid Finger Length:80mm
3,Handle Diameter:50mm
4,Handle Length:80mm
5, According to : IEC61032:1997 Figure 16
Appliance :
This probe is intended to verify the protection against access to glowing heating elements.
Company Profile
14 Stanards drafted and issued by Labthink -- 100 Patents granted by Labthink -- 410 m2 Laboratory to provide testing services -- 20 years experienced lab technicians to provide solutions -- 12 months warranty -- Remote Services (Free of Charge allthrough lifetime)
Contact Us
- Shenzhen Bonad Instrument Co., Ltd.
-
Joint Finger Probe articulated finger probe
-
IEC61032 Test Pin 13 test probe in instrument parts& accessories
-
IEC61032 Test Probe 31(Grinding Probe) vaginal probe
-
IEC 125mm Test Finger Probe standard test finger in testing equipment
-
standard test finger iec IEC61032 IEC60529 test probe D
-
IEC 61032 children test finger probe for Electrical Safety testing lab children test probe
-
IEC61032 IP4X Test Probe D
-
Articulated test finger probe joint finger probe
-
High quality IP1X Test Probe A with 50MM diameter sphere
-
IEC 60335-1 Figure 7 Test Finger Nail with 30N Force Gauges
-
Short Test Pin Probe for IEC 61032 Test Probe 13, IEC 61032 Figure 9 Test Probe 13
-
IP2 Jointed Test Finger/ IEC Test Probe B standard test finger
-
IEC61032 IP2X Movable IEC Test Finger B
-
IEC61032 figure 3 wire testing probe
-
IEC61032 figure 2 test probe finger B
-
IEC61032 test fingernail with 50N force
-
IEC60335 figure 7 test fingernail / IP test probe
-
Articulated Test Finger for Electrical Safety Test
-
IEC60335-2-24 Scratch Tool Tip Test Probe
-
Promotion discount! IEC61032 figure 1 IP1X Test Probe A with a 50mm stainless sphere
-
IEC60884 IEC61032 Socket outlet protection test probe 14B
-
IP3X Accessibility Probes IEC 61032 Test Equipment Probe C
-
Promotion price! IEC60598 copper and zine alloy test chain
-
IEC61032 Accessibility probe test rod 41 with 30mm diameter and 80mm length
Find Similar Products By Category
- Measurement & Analysis Instruments > Instrument Parts & Accessories
- Buy on GoldSupplier.com
- How to Buy
- Browse by Catagories
- Browse by Hot Regoins
- Private Sourcing Events
- B2B Articles
- Sell on GoldSupplier.com
- How to Sell
- Post Products
- Manage Products
- Manage Groups
- About
- About Us
- Link to Us
- Contact Us
- Sitemap
- Please Enter your Email Address
- Please enter the content for your inquiry.
We will find the most reliable suppliers for you according to your description.
Send Now-
sales
Welcome to my shop! Glad to serve you!Please send your question!
Your message has exceeded the limit.
Your message has exceeded the limit.
-
-
Your inquiry content must be between 20 to 5000 characters.Send Now.
-
Please input the mailbox.
-