- Hk Lee Hing Industry Co., Limited
-
Zaozhuang, Shandong, China
- Main products: go no go gauges, ip tester, test probe kit, impact test equipment, test probes, plug and receptacles gauge, ce lvd standards, spring hammer, ac hipot tester, earthing test instrument, iec 61032 test probe b, impulse hammer, impact hammer
Home > Products > Test Probe,Test Finger,Test Pin > Test Probe B of IEC61032
Test Probe B of IEC61032
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- 7 days
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Product Details
| Brand Name | Julixing | Place of Origin | China | |
| Model Number | LX-1202 |
Product Description
The Jointed Test Finger is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL and in most of the rules involved in the verification of accessibility to live parts.
Technical Parameters:
1. Knurled Finger Diameter:12 mm
2. Knurled Finger Length:80 mm
3. Baffle Plate Diameter:50 mm
4. Baffle Plate Length:100 mm
5. Baffle thickness:20 mm
Application:
1. The joint part of The Standard Test Knurled Finger Probe can't touch the live parts or close to the dangerous parts, and50 mmto20 mmbaffle plate cannot enter.
2. In the prevent electric shock test, wirings , power devices, and lighting devices are needed.
Notes:
Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.
Contact Us
- Hk Lee Hing Industry Co., Limited
- Contact nameEason Wang Chat Now
- Phone86-755-33168386
- Address1F Junfeng Building, Gongle, Xixiang, Baoan District, Zaozhuang, Shandong
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