MFD650C Ultrasonic Flaw Detector,digital Ultrasonic Flaw Tester,cheap Portable Ultrasonic Flaw Tester

MFD650C Ultrasonic Flaw Detector

MFD650C Portable Ultrasonic Flaw Detector with hi-resolution color TFT LCD display.
The background color and the wave color can be selectable according to the environment. LCD brightness can be manually set. Continue working over 8 hours with high performance lithium-ion battery module (with large capacity lithium-ion battery option), easy to be dismantled and the battery module can be charged independently offline. It is light and portable, easily to be taken by one hand; easy operation; superior reliability makes it long life.

RANGE

0~ 9999mm (at steel velocity); range selectable in fixed steps or continuously variable.

PULSER

Spike excitation with low, middle and high choices of the pulse energy.

Pulse Repetition Rate: manually adjustable from 10 to 1000 Hz.

Pulse width: Adjustable in a certain range to match different probes.
Damping: 200Ω, 300Ω, 400Ω, 500Ω, 600Ωselectable to meet different resolution and sensitivity need.
Probe work mode: Single element, dual element and through transmission;

RECEIVER

Real-time sampling at 160MHz high speed enough to record the defect information.
Rectification: Positive half wave, negative halfwave, full wave, and RF

DB Step: 0dB, 0.1 dB, 2dB, 6dB step value as well as auto-gain mode

ALARM
Alarm with sound and light,.

Memory

Total 100 configuration channels store all instrument operating parameters plus DAC/AVG curve; stored configuration data can be easily previewed and recalled for quick, repeatable instrument setup. Total 1000 datasets store all instrument operating parameters plus A-scan. All the configuration channels and datasets can be transferred to PC via USB port.
FUNCTIONS

Peak Hold:

Automatically searching the peak wave inside the gate and hold it on the display.

Equivalent diameter calculation: find out the peak echo and calculate its equivalent diameter.

Continuous Record: Record the display continuously and save it to the memory inside the instrument.

Defect Localization: Localize the defect position, including the distance, the depth and its plane projection distance.

Defect Sizing: calculate the defect size

Defect Evaluation: Evaluate the defect by echo envelope.

DAC: Distance Amplitude Correction

AVG: Distance Gain Size curve function

Crack measure: Measure and calculate the crack depth

B-SCAN: Display the cross-section of the test block.

REAL-TIME CLOCK
Real time clock for tracking the time.

COMMUNICATION
USB2.0 high-speed communication port

SPECIFICATIONS

Channels: 100 channels
Range: (0 ~ 9999) mm
Bandwidth: (0.5 ~ 15) MHz
Material Velocity: (300 ~ 15000) m / s
Dynamic Range: ≥ 36dB
Vertical linear error: ≤ 2.5%
Horizontal linear error: ≤ 0.1%
Resolution:> 40dB (5P14)
Sensitivity Leavings: 65dB (flat-bottomed deep hole 200mmΦ2)
Rejection: (0 to 80)% Linear
Noise level: ≤ 8%
Power supply: DC 9V; lithium batteries work for 8 hours or more
Ambient temperature: (-20 ~ 50) °C
Relative Humidity: (20 ~ 95)% RH
Overall dimensions: 263 × 170 × 61 (mm)

Standard Configuration