Support Rings, Impact Device/probe for Portable Leeb Hardness Tester
Impact device/probe for portable leeb hardness tester
Type of impact device |
DC(D)/DL |
D+15 |
C |
G |
E |
|
Impacting energy Mass of impact body |
11mJ 5.5g/7.2g |
11mJ 7.8g |
2.7mJ 3.0g |
90mJ 20.0g |
11mJ 5.5g |
|
Test tip hardness: Dia. Test tip: Material of test tip: |
1600HV 3mm Tungsten carbide |
1600HV 3mm Tungsten carbide |
1600HV 3mm Tungsten carbide |
1600HV 5mm Tungsten carbide |
5000HV 3mm synthetic diamond |
|
Impact device diameter: Impact device length: Impact device weight: |
20mm 86(147)/ 75mm 50g |
20mm 162mm 80g |
20mm 141mm 75g |
30mm 254mm 250g |
20mm 155mm 80g |
Max. hardness of sample |
940HV |
940HV |
1000HV |
650HB |
1200HV |
Mean roughness value of sample surface Ra: |
1.6μm |
1.6μm |
0.4μm |
6.3μm |
1.6μm |
|
Min. weight of sample: Measure directly Need support firmly Need coupling tightly |
>5kg 2~5kg 0.05~2kg |
>5kg 2~5kg 0.05~2kg |
>1.5kg 0.5~1.5kg 0.02~0.5kg |
>15kg 5~15kg 0.5~5kg |
>5kg 2~5kg 0.05~2kg |
|
Min. thickness of sample Coupling tightly Min. layer thickness for surface hardening |
5mm
≥0.8mm |
5mm
≥0.8mm |
1mm
≥0.2mm |
10mm
≥1.2mm |
5mm
≥0.8mm |
|
Size of tip indentation
| ||||||
Hardness 300HV |
Indentation diameter Depth of indentation |
0.54mm
24μm |
0.54mm
24μm |
0.38mm
12μm |
1.03mm
53μm |
0.54mm
24μm |
Hardness 600HV |
Indentation diameter Depth of indentation |
0.54mm
17μm |
0.54mm
17μm |
0.32mm
8μm |
0.90mm
41μm |
0.54mm
17μm |
Hardness 800HV |
Indentation diameter Depth of indentation |
0.35mm
10μm |
0.35mm
10μm |
0.35mm
7μm |
--
-- |
0.35mm
10μm |
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