Electronic Technology Training Bench, Analog Digital Training Device, OEM Service

Plywood case packing, double layer packing

Specifications

1. Product Overviews:

XK-DZ201 integrated the analog electronics technique handled box and digital electronic technique handled box. XK-DZ201 is one training equipment with strong integration, suitable for electronic major of various higher institution,vocational college,technician training school to proceed teaching experiments,skill assessment and pre-job training.

XK-DZ201 adopts structure of standard small modularization, it’s with reasonable layout and well appearance. Training bench include AC power supply,DC power supply,function signal generator,analog electronic handled box (various of diode circuit,transistor circuit,amplifying circuit,waveform generator circuit,discrete device etc.), digital electronic handled box (various gate circuits,input output,trigger circuit,combination/sequential logic circuit,CPLD circuit etc.).

2. Experiment Bench Technology Parameter:

2.1 Product Size: 1700mm × 700mm × 1600mm (L*W*H)

2.2 Power Supply: single phase three wires AC220V, 50Hz, 0.5KVA

3. Signal Source Technology Parameter

3.1 Adjustable 1.25~15V DC voltage source, capacity 1A

3.2 2-way AC 15V voltage source, capacity 1A

3.3 DC ±12V voltage source, capacity 0.5A

3.4 DC ±5V voltage source, capacity 0.5A

3.5 Signal generator: output frequency,square wave,triangular wave,sine wave

4. Accessory for experiment bench

4.1 Experiment jumper wires: 50 pcs

4.2 Bread board jumper wires: 30 pcs

4.3 USB blaster download wire: 1 pcs

4.4 Quartus II7.2 developed environment: 1set

4.5 General programmer: 1set

4.6 English manual: 1 pcs 

5. Experiment Project

5.1 Rectifier circuit experiment

5.2 Filter circuit experiment

5.3 Stabilivolt diode experiment

5.4 Triode series connection stabilivolt power supply experiment

5.5 Three-terminal voltage regulator power supply experiment

5.6 Common emitter amplifier circuit experiment

5.7 Common collector amplifier circuit experiment

5.8 Common base amplifier circuit experiment

5.9 Differential amplifier circuit experiment

5.10 Resistance capacity coupling two-stage amplifier circuit experiment

5.11 Direct coupling two-stage amplifier circuit experiment

5.12 Photoelectric coupling circuit

5.13 Proportion operation amplifier circuit experiment

5.14 Addition circuit experiment

5.15 Subtraction circuit experiment

5.16 Differential circuit experiment

5.17 Integral circuit experiment

5.18 Active low-pass filter circuit experiment

5.19 Active high-pass filter circuit experiment

5.20 RC bridge sine wave oscillator circuit experiment

5.21 LC capacitance feedback sinusoidal wave oscillation circuit experiment

5.22 Power amplification circuit experiment

5.23 Semiconductor diode, triode switch characteristics research

5.24 Discrete components logic gate circuit

5.25 Basic gate circuit test experiment

5.26 TTL integrated logical gate logic function and parameter test

5.27 CMOS integrated logical gate logic function and parameter test

5.28 TTL collector open circuit gate and tri-state output gate applications

5.29 Combinational logic circuit analysis and design

5.30 Decoder and its application

5.31 Numerical comparator experiment

5.32 Arithmetic logic unit experiment

5.33 Trigger and its application

5.34 Shift register and its application

5.35 Counter and its application

5.36 Pulse signal generating circuit

5.37 Pulse time delay and waveform shaping circuit

5.38 555 time-base circuit and its application

5.39 D/A conversion circuit

5.40 A/D conversion circuit

5.41 RAM experiment

5.42 ROM experiment

5.43 GAL programming experiment

5.44 CPLD programming experiment

5.45 Multi-way responder